西安电子科技大学主页平台管理系统 Changqing Xu Total Ionizing Dose Effect Simulation Study on 130 Nm Cmos Processor Home-j9国际集团直营

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Total Ionizing Dose Effect Simulation Study on 130 Nm Cmos Processor

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Title of Paper:Total Ionizing Dose Effect Simulation Study on 130 Nm Cmos Processor

Journal:Micromachines

Correspondence Author:徐长卿

Volume:17

Issue:1

Translation or Not:No

Date of Publication:2026-01-01

Date:2026-03-31

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